Mitutoyo 178-533-02A SJ-500 Surftest Surface Roughness Tester, 4 mN

Modèle: 178-533-02A

Mitutoyo 178-533-02A SJ-500 Surftest Surface Roughness Tester, 4 mN

Modèle: 178-533-02A

Work with easy operation and high-accuracy analysis of surface roughness and fine contours with this surftest roughness tester that features a 4 mN measuring force and a 7.5" (190.5 mm) color TFT LCD. In addition, this roughness tester has various types of analysis, improved operability, and high durability.

Work with easy operation and high-accuracy analysis of surface roughness and fine contours with this surftest roughness tester that features a 4 mN measuring force and a 7.5" (190.5 mm) color TFT LCD. In addition, this roughness tester has various types of analysis, improved operability, and high durability.

Votre prix $19006.00 CAD
Disponibilité 2 à 3 semaines
Quantité

Mitutoyo 178-533-02A offre

Save and recall measurement setups with this roughness tester that features up to 10 measurement setups. In addition, this tester is a dedicated data processor that includes a customizable menu screen, statistical processing, contour analysis, and a vertical adjustable knob.

Caractéristiques

  • Vertical adjustable knob: Essential for positioning the stylus close to the workpiece!
  • Support for testing problematic features: Supports measurement in the axial direction for shrouded features, such as found on crankshafts, by simply swiveling the detector through 90 degrees
  • Drive unit inclination adjustment mechanism: Digital Adjustment Tilting (DAT) function is supplied as standard for efficient leveling of workpieces: ±1.5° DAT function: Patent pending (Japan, U.S., Germany)
  • Class-leading traverse straightness: 8 μin/2" (0.2 μm/50 mm)
  • High-speed traverse at up to 0.78"/s (20mm/s) under joystick control
  • Efficient positioning by joystick and adjustment knobs: Both a fast-traverse joystick (X-axis: 0.78"/s (20mm/s)
  • Multiple trace programming function: A machine can be programmed to take up to three consecutive traces by one-key operation
  • Ceramic guideway: A ceramic guideway, inherently free from wear and deterioration with age, is employed to maintain the traversing straightness of the drive unit (X-axis) indefinitely (Maintenance-free design, since anti-corrosion treatment is not required for ceramic)
  • Customizable menu screen: The menu customization function allows display of frequently used menu icons
  • Saving and recalling measurement setups: Up to 10 measurement setups can be saved to and recalled from internal memory
  • Easy, icon-based input of setup conditions *patent pending: Setups are aided by icons representing ISO/JIS roughness standard parameters with appropriate values selected from recommended lists
  • Fine-contour analysis: Various contour analyses (area, circle, angle, coordinate difference, step, inclination) are supplied as standard
  • A portable tester also boasting high performance in desktop applications

High-visibility color display panel

A high-visibility 7.5" (190.5 mm) color TFT LCD, color icon display and touchoperated panel provide user-friendly, easy operation. Built-in thermal printer. Fine contour analysis provided as standard.

Statistical processing

Statistical data processing possible (up to 300 data samples). Statistical processing items: MAX, MIN, average, standard deviation, histogram, probability of acceptance.

Analysis to international standards

Evaluates surface roughness using up to 43 parameters complying with international standards such as ISO 1997 and JIS 2001. Bearing Area Curve (BAC), Amplitude Distribution Curve (ADC), and power spectrum (wavelength display) are readily available in graph form.

Built-in thermal printer

Measurement data is printed by the highdefinition, high-speed thermal printer. In addition to calculation results and evaluation results, BAC, ADC and other curves can also be printed.

Applications

  • Aerospace
  • Automotive
  • Defense
  • Energy
  • General manufacturing
  • Medical

Spécifications pour le Mitutoyo 178-533-02A

Type of Data Processing Dedicated data processor
Measuring Force of Detector 4 mN
Travel Range (Operation) X axis: 2" (50 mm), power drive/manual
Measuring Range X axis: 2" (50 mm)
Z1 axis (detector unit): 3200/3200/320μin (800/80/8μm)
Resolution X axis: 1.97 μin (0.05 μm)
Z1 axis (detector unit): 0.4/3200 μin range, 0.4/3200 μin range, 0.004/320 μin range (0.01/800 μm range, 0.001/80 μm range, 0.0001/8 μm range)
Power Drive Speed X axis: 0 to 0.78"/s 0 to 20 mm/s (via joystick)
Measuring Speed 0.00078 to 0.2"/s (0.02 to 5mm/s)
Traverse Guideway Straightness 8 μin/2" (0.2 μm/50mm)
Stylus Up/Down Operation Arc movement
Point of Stylus Downward
Detector Measuring force: 4 mN
4mN detector: 90°, R5 μm
Applicable Standards JIS’82 / JIS’94 / JIS’01 / ISO’97 / ANSI / VDA
Assessed Profiles Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif, waviness motif
PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile), roughness motif, waviness motif
Evaluation Parameters Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),δc, mr, tp, Htp, Lo, lr, Ppi, HSC, Δa, Δq, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, λa, λq, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), customization
PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pmr (c), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rmr (c), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wmr (c), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW
Analysis Graphs Dedicated data processor type: ADC, BAC, power spectrum graph
PC system type: ADC, BAC graph, power spectrum graph, auto-correlation graph, walsh power spectrum graph, walsh auto-correlation graph, slope distribution graph, local peak distribution graph, parameter distribution graph
Curved Surface Compensation Dedicated data processor type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation conic compensation, inclination (Entire, arbitrary)
PC system type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation, conic compensation, inclination (Entire, arbitrary), polynomial compensation
Contour Analysis Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination
PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination
Filters Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline
PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Rubust-spline
Dimensions 16.7 x 3.7 x 6.3" (425 x 94 x 160 mm)
Weight 5.9 lbs (2.7 kg)

Le Mitutoyo 178-533-02A comprend

  • Mitutoyo 178-533-02A SJ-500 Surftest Surface Roughness Tester, 4 mN

Poser une question sur le Mitutoyo 178-533-02A SJ-500 Surftest Surface Roughness Tester, 4 mN

Mitutoyo 178-533-02A offre

Save and recall measurement setups with this roughness tester that features up to 10 measurement setups. In addition, this tester is a dedicated data processor that includes a customizable menu screen, statistical processing, contour analysis, and a vertical adjustable knob.

Caractéristiques

  • Vertical adjustable knob: Essential for positioning the stylus close to the workpiece!
  • Support for testing problematic features: Supports measurement in the axial direction for shrouded features, such as found on crankshafts, by simply swiveling the detector through 90 degrees
  • Drive unit inclination adjustment mechanism: Digital Adjustment Tilting (DAT) function is supplied as standard for efficient leveling of workpieces: ±1.5° DAT function: Patent pending (Japan, U.S., Germany)
  • Class-leading traverse straightness: 8 μin/2" (0.2 μm/50 mm)
  • High-speed traverse at up to 0.78"/s (20mm/s) under joystick control
  • Efficient positioning by joystick and adjustment knobs: Both a fast-traverse joystick (X-axis: 0.78"/s (20mm/s)
  • Multiple trace programming function: A machine can be programmed to take up to three consecutive traces by one-key operation
  • Ceramic guideway: A ceramic guideway, inherently free from wear and deterioration with age, is employed to maintain the traversing straightness of the drive unit (X-axis) indefinitely (Maintenance-free design, since anti-corrosion treatment is not required for ceramic)
  • Customizable menu screen: The menu customization function allows display of frequently used menu icons
  • Saving and recalling measurement setups: Up to 10 measurement setups can be saved to and recalled from internal memory
  • Easy, icon-based input of setup conditions *patent pending: Setups are aided by icons representing ISO/JIS roughness standard parameters with appropriate values selected from recommended lists
  • Fine-contour analysis: Various contour analyses (area, circle, angle, coordinate difference, step, inclination) are supplied as standard
  • A portable tester also boasting high performance in desktop applications

High-visibility color display panel

A high-visibility 7.5" (190.5 mm) color TFT LCD, color icon display and touchoperated panel provide user-friendly, easy operation. Built-in thermal printer. Fine contour analysis provided as standard.

Statistical processing

Statistical data processing possible (up to 300 data samples). Statistical processing items: MAX, MIN, average, standard deviation, histogram, probability of acceptance.

Analysis to international standards

Evaluates surface roughness using up to 43 parameters complying with international standards such as ISO 1997 and JIS 2001. Bearing Area Curve (BAC), Amplitude Distribution Curve (ADC), and power spectrum (wavelength display) are readily available in graph form.

Built-in thermal printer

Measurement data is printed by the highdefinition, high-speed thermal printer. In addition to calculation results and evaluation results, BAC, ADC and other curves can also be printed.

Applications

  • Aerospace
  • Automotive
  • Defense
  • Energy
  • General manufacturing
  • Medical

Spécifications pour le Mitutoyo 178-533-02A

Type of Data Processing Dedicated data processor
Measuring Force of Detector 4 mN
Travel Range (Operation) X axis: 2" (50 mm), power drive/manual
Measuring Range X axis: 2" (50 mm)
Z1 axis (detector unit): 3200/3200/320μin (800/80/8μm)
Resolution X axis: 1.97 μin (0.05 μm)
Z1 axis (detector unit): 0.4/3200 μin range, 0.4/3200 μin range, 0.004/320 μin range (0.01/800 μm range, 0.001/80 μm range, 0.0001/8 μm range)
Power Drive Speed X axis: 0 to 0.78"/s 0 to 20 mm/s (via joystick)
Measuring Speed 0.00078 to 0.2"/s (0.02 to 5mm/s)
Traverse Guideway Straightness 8 μin/2" (0.2 μm/50mm)
Stylus Up/Down Operation Arc movement
Point of Stylus Downward
Detector Measuring force: 4 mN
4mN detector: 90°, R5 μm
Applicable Standards JIS’82 / JIS’94 / JIS’01 / ISO’97 / ANSI / VDA
Assessed Profiles Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif, waviness motif
PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile), roughness motif, waviness motif
Evaluation Parameters Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),δc, mr, tp, Htp, Lo, lr, Ppi, HSC, Δa, Δq, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, λa, λq, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), customization
PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pmr (c), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rmr (c), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wmr (c), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW
Analysis Graphs Dedicated data processor type: ADC, BAC, power spectrum graph
PC system type: ADC, BAC graph, power spectrum graph, auto-correlation graph, walsh power spectrum graph, walsh auto-correlation graph, slope distribution graph, local peak distribution graph, parameter distribution graph
Curved Surface Compensation Dedicated data processor type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation conic compensation, inclination (Entire, arbitrary)
PC system type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation, conic compensation, inclination (Entire, arbitrary), polynomial compensation
Contour Analysis Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination
PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination
Filters Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline
PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Rubust-spline
Dimensions 16.7 x 3.7 x 6.3" (425 x 94 x 160 mm)
Weight 5.9 lbs (2.7 kg)

Le Mitutoyo 178-533-02A comprend

  • Mitutoyo 178-533-02A SJ-500 Surftest Surface Roughness Tester, 4 mN

Poser une question sur le Mitutoyo 178-533-02A SJ-500 Surftest Surface Roughness Tester, 4 mN

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