Work with easy operation and high-accuracy analysis of surface roughness and fine contours with this surftest roughness tester that features a 4 mN measuring force and a 7.5" (190.5 mm) color TFT LCD. In addition, this roughness tester has various types of analysis, improved operability, and high durability.
Work with easy operation and high-accuracy analysis of surface roughness and fine contours with this surftest roughness tester that features a 4 mN measuring force and a 7.5" (190.5 mm) color TFT LCD. In addition, this roughness tester has various types of analysis, improved operability, and high durability.
Save and recall measurement setups with this roughness tester that features up to 10 measurement setups. In addition, this tester is a dedicated data processor that includes a customizable menu screen, statistical processing, contour analysis, and a vertical adjustable knob.
Caractéristiques
High-visibility color display panel
A high-visibility 7.5" (190.5 mm) color TFT LCD, color icon display and touchoperated panel provide user-friendly, easy operation. Built-in thermal printer. Fine contour analysis provided as standard.
Statistical processing
Statistical data processing possible (up to 300 data samples). Statistical processing items: MAX, MIN, average, standard deviation, histogram, probability of acceptance.
Analysis to international standards
Evaluates surface roughness using up to 43 parameters complying with international standards such as ISO 1997 and JIS 2001. Bearing Area Curve (BAC), Amplitude Distribution Curve (ADC), and power spectrum (wavelength display) are readily available in graph form.
Built-in thermal printer
Measurement data is printed by the highdefinition, high-speed thermal printer. In addition to calculation results and evaluation results, BAC, ADC and other curves can also be printed.
Applications
Type of Data Processing | Dedicated data processor |
Measuring Force of Detector | 4 mN |
Travel Range (Operation) | X axis: 2" (50 mm), power drive/manual |
Measuring Range | X axis: 2" (50 mm) Z1 axis (detector unit): 3200/3200/320μin (800/80/8μm) |
Resolution | X axis: 1.97 μin (0.05 μm) Z1 axis (detector unit): 0.4/3200 μin range, 0.4/3200 μin range, 0.004/320 μin range (0.01/800 μm range, 0.001/80 μm range, 0.0001/8 μm range) |
Power Drive Speed | X axis: 0 to 0.78"/s 0 to 20 mm/s (via joystick) |
Measuring Speed | 0.00078 to 0.2"/s (0.02 to 5mm/s) |
Traverse Guideway Straightness | 8 μin/2" (0.2 μm/50mm) |
Stylus Up/Down Operation | Arc movement |
Point of Stylus | Downward |
Detector | Measuring force: 4 mN 4mN detector: 90°, R5 μm |
Applicable Standards | JIS’82 / JIS’94 / JIS’01 / ISO’97 / ANSI / VDA |
Assessed Profiles | Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif, waviness motif PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile), roughness motif, waviness motif |
Evaluation Parameters | Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),δc, mr, tp, Htp, Lo, lr, Ppi, HSC, Δa, Δq, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, λa, λq, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), customization PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pmr (c), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rmr (c), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wmr (c), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW |
Analysis Graphs | Dedicated data processor type: ADC, BAC, power spectrum graph PC system type: ADC, BAC graph, power spectrum graph, auto-correlation graph, walsh power spectrum graph, walsh auto-correlation graph, slope distribution graph, local peak distribution graph, parameter distribution graph |
Curved Surface Compensation | Dedicated data processor type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation conic compensation, inclination (Entire, arbitrary) PC system type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation, conic compensation, inclination (Entire, arbitrary), polynomial compensation |
Contour Analysis | Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination |
Filters | Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Rubust-spline |
Dimensions | 16.7 x 3.7 x 6.3" (425 x 94 x 160 mm) |
Weight | 5.9 lbs (2.7 kg) |
Type of Data Processing | Dedicated data processor |
Measuring Force of Detector | 4 mN |
Travel Range (Operation) | X axis: 2" (50 mm), power drive/manual |
Measuring Range | X axis: 2" (50 mm) Z1 axis (detector unit): 3200/3200/320μin (800/80/8μm) |
Resolution | X axis: 1.97 μin (0.05 μm) Z1 axis (detector unit): 0.4/3200 μin range, 0.4/3200 μin range, 0.004/320 μin range (0.01/800 μm range, 0.001/80 μm range, 0.0001/8 μm range) |
Power Drive Speed | X axis: 0 to 0.78"/s 0 to 20 mm/s (via joystick) |
Measuring Speed | 0.00078 to 0.2"/s (0.02 to 5mm/s) |
Traverse Guideway Straightness | 8 μin/2" (0.2 μm/50mm) |
Stylus Up/Down Operation | Arc movement |
Point of Stylus | Downward |
Detector | Measuring force: 4 mN 4mN detector: 90°, R5 μm |
Applicable Standards | JIS’82 / JIS’94 / JIS’01 / ISO’97 / ANSI / VDA |
Assessed Profiles | Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif, waviness motif PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile), roughness motif, waviness motif |
Evaluation Parameters | Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),δc, mr, tp, Htp, Lo, lr, Ppi, HSC, Δa, Δq, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, λa, λq, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), customization PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pmr (c), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rmr (c), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wmr (c), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW |
Analysis Graphs | Dedicated data processor type: ADC, BAC, power spectrum graph PC system type: ADC, BAC graph, power spectrum graph, auto-correlation graph, walsh power spectrum graph, walsh auto-correlation graph, slope distribution graph, local peak distribution graph, parameter distribution graph |
Curved Surface Compensation | Dedicated data processor type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation conic compensation, inclination (Entire, arbitrary) PC system type: Parabolic compensation, hyperbolic compensation, elliptical compensation, circular compensation, conic compensation, inclination (Entire, arbitrary), polynomial compensation |
Contour Analysis | Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination |
Filters | Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Rubust-spline |
Dimensions | 16.7 x 3.7 x 6.3" (425 x 94 x 160 mm) |
Weight | 5.9 lbs (2.7 kg) |